By Zhiyong Ma,David G. Seiler
ISBN-10: 9814745081
ISBN-13: 9789814745086
Nanoelectronics is altering the best way the realm communicates, and is remodeling our day-by-day lives. carrying on with Moore’s legislations and miniaturization of low-power semiconductor chips with ever-increasing performance were relentlessly using R&D of recent units, fabrics, and technique functions to satisfy functionality, energy, and value specifications. This e-book covers updated advances in examine and practices in nanometrology, serious for carrying on with expertise scaling and product innovation. It holistically techniques the subject material and addresses rising and critical themes in semiconductor R&D and production. it's a entire consultant for metrology and diagnostic options crucial for procedure expertise, electronics packaging, and product improvement and debugging—a special approach in comparison to different books. The authors are from academia, executive labs, and and feature big event and services within the themes offered. The booklet is meant for all these thinking about IC production and nanoelectronics and for these learning nanoelectronics method and meeting applied sciences or operating in equipment checking out, characterization, and diagnostic recommendations.
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Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma,David G. Seiler
by Edward
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